중금속분석(RoHs)+도금두께측정+다원소분석겸용
Energy Dispersive X-Ray Fluorescence Spectrometer
Full elements analysis software
*experience coefficient method.
*basic parameter method.
*coefficient method.
Energy Dispersive X-Ray Fluorescence Spectrometer
“Nayur사 model NDA-200”
Desktop NDA-200(본체)
*X-Y Stage.
*X-123 High performance Detector.
*resolution:149ev, Amptek/ USA)
*Si-Pin Semiconductor Detector
*±0.02% Precision High voltage
*MNX-50P50(Spellman/USA).
*Camera position correction system.
*Automatic multi-layer filter changer.
*R&R & CPK Report output.
*Triplication radiation cutoff.
*Multi language support.
*Thickness measurement.
*Minimum size of light spot : 0.5mm
*Standard Sample(4ea)