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작성일 : 12-12-06 11:45
중금속분석(RoHs)+도금두께측정+다원소분석겸용
 글쓴이 : 관리자
조회 : 5,596  
   XRF(NDA200) 카탈로그(메일용).pdf (7.9M) [208] DATE : 2012-12-10 14:07:34
   ED-XRF카탈로그.pdf (15.4M) [163] DATE : 2012-12-10 14:10:11

 
중금속분석(RoHs)+도금두께측정+다원소분석겸용
Energy Dispersive X-Ray Fluorescence Spectrometer
 
 
 
Full elements  analysis software
*experience coefficient method.      
*basic parameter method.
*coefficient method.
 
 
Energy Dispersive X-Ray Fluorescence Spectrometer
“Nayur사 model NDA-200”
 
 
 
Desktop NDA-200(본체)
 
*X-Y Stage.
*X-123 High performance Detector.
*resolution:149ev, Amptek/ USA)
*Si-Pin Semiconductor Detector      
*±0.02% Precision High voltage
*MNX-50P50(Spellman/USA).    
*Camera position correction system.      
*Automatic multi-layer filter changer.       
*R&R & CPK Report output.      
*Triplication radiation cutoff.          
*Multi language support.
*Thickness measurement.
*Minimum size of light spot : 0.5mm 
*Standard Sample(4ea)